二元序列的错误线性复杂度性质Properties of Error Linear Complexity of Binary Sequences
常祖领,王宁
摘要(Abstract)：
详细研究了二元2的幂次周期序列的错误线性复杂度的性质.利用Games-Chan算法作为基本工具,详细分析了2的幂次周期并且严格点少的二元序列的密码学性质.给出了具有两个严格点的序列的详细性质以及具有三个严格点的序列的结构.
关键词(KeyWords)： 二元序列;Games-Chan算法;错误线性复杂度;严格点
基金项目(Foundation): 国家自然科学基金联合基金资助项目(u1301604);; 河南省教育厅科学技术研究重点项目(14A110022);; 福建省网络安全与密码技术重点实验室(福建师范大学)开放课题(15005)
作者(Author): 常祖领,王宁
参考文献(References)：
- [1]MENEZES A J,OORSCGOT P C,VANSTONE S A.Handbook of applied cryptography[M].Boca Raton FL:CRC Press,1996:176—233.
- [2]RUPPEL R A.Analysis and design of stream ciphers[M].New York:Springer-Verlag,1986:133—200.
- [3]MASSEY J L.Shift register synthesis and BCH decoding[J].IEEE transactions on information theory,1969,15(1):122—127.
- [4]GAMES R A,CHAN A H.A fast algorithm for determining the complexity of a pseudo-random sequence with period 2n[J].IEEE transactions on information theory,1983,29(1):144—146.
- [5]STAMP M,MARTIN C F.An algorithm for the k-error linear complexity of binary sequences with period 2n[J].IEEE transactions on information theory,1993,39(4):1398—1401.
- [6]LAUDER A,PATERSON K.Computing the error linear complexity spectrum of a binary sequence of period 2n[J].IEEE transactions on information theory,2003,49(1):273—280.
- [7]SALAGEAN A.On the computation of the linear complexity and the k-error linear complexity of binary sequences with period a power of two[J].IEEE transactions on information theory,2005,51(3):1145—1150.
- [8]ETZION T,KALOUPTSIDIS T N,KOLOKOTRONIS N,et al.Properties of the error linear complexity spectrum[J].IEEE transactions on information theory,2009,55(10):4681—4686.
- [9]KUROSAWA K,SATO F,KISHIMOTO W.A relation between linear complexity and k-error linear complexity[J].IEEE transactions on information theory,2000,46(2):694—698.
- [10]CHANG Z,WEN Q.On the cryptographic properties of binary 2n-periodic sequences[J].Chinese journal of electronics,2011,20(2):307—311.
- [11]CHANG Z,WANG X.On the first and second error linear complexity of binary 2n-periodic sequences[J].Chinese journal of electronics,2013,22(1):1—6.